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Defectomat CI Compact Intelligence

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Defectomat CI  Compact Intelligence
Defectomat CI Compact Intelligence
Price And Quantity
  • 1
  • Unit/Units
  • INR
Product Specifications
  • Metal
  • White
  • Industrial,Laboratory
  • 3 Kilograms (kg)
  • 220 Volt (v)
Product Description

This Defectomat CI Compact Intelligence device is designed for quality testing as well as process monitoring of a range of long products. It is developed to conduct hot testing and bright steel processing steps.  This is designed to be operated in contactless as well as non-destructive manner as per the eddy current method. In addition, it is used to detect short defects like holes, transverse or localized defects. It is also ideal to detect the defective materials with its fully automatic design.

Features of Defectomat CI Compact Intelligence:

  • Defects can be easily classified, marked, and mechanically discarded
  • Testing speed is 150 m/s even at high production speeds
  • Ideal for low operating costs processes
  • Perfect for non-destructive eddy current testing of wire, tubes, rods, and profiles

Technical specification

Design

Round, Flat, Angled

Type Of Testing Machines

Eddy Current Dynamometer

Use

In Eddy Current



Trade Information
  • 15-20 Per Month
  • 4-8 Week
  • All India
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Contact Us

EEC House, C-7, Dalia Industrial Estate, Off New Link Road, Opp. Laxmi Industrial Estate, Andheri (West), Mumbai, Maharashtra, 400053, India
Phone :+918037301493